March 1, 2018 (Vol. 38, No. 5)

ZEISS

Developed in collaboration with the UCal–San Diego, this new new Focal Charge Compensation module for block-face imaging is compatible with the GeminiSEM and 3View® from Gatan. Focal Charge Compensation expands versatility and considerably increases data quality without prolonging acquisition times and enables easy imaging of even the most charge-prone samples. Resin-embedded tissues and cells can be imaged without charging artifacts, while the pixel dwell time is reduced. Decreasing beam exposure time not only ensures fast acquisition rates, but also guards against sample damage.