November 1, 2018 (Vol. 38, No. 19)
The SpectraLock Optical Monitoring System provides in situ monitoring and deposition rate control to produce single- and multi-layered thin films with exacting accuracy, time after time, without iteration or error. It is an innovative optical monitoring system with exceptional precision and unmatched thin-film reproduction capabilities. The advanced system produces optical coatings to the precise specifications of the original optical design because of its index dispersion enhanced optical monitoring (IDEM) features. Using SpectraLock, a single test run can confirm that the coating matches its design, instead of the traditional method of performing multiple test runs until a coating iteration comes close to matching the design.