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August 1, 2012 (Vol. 32 , No. 14)

Time-of-Flight Mass Spectrometers

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Equipped with StepWave™’s off-axis ion source technology, Xevo G2-S® QTof and Xevo G2-S Tof mass spectrometers are up to 20x more sensitive than earlier-generation instruments. StepWave ion optics technology transfers ions from the ion source with high efficiency while actively filtering out undesirable neutral contaminants. As a result, MS signals are increased, quantitative results are more reproducible, and laboratories experience less downtime due to routine cleaning and maintenance.


  • Waters
  • 34 Maple Street
  • Milford AL, 01757

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