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December 1, 2012 (Vol. 32 , No. 21)

Benchtop Scanning Electron Microscope

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McCrone Microscopes & Accessories

With a magnification range of up to 60,000X, redesigned with touchscreen software controls, and an optional energy-dispersive X-ray spectroscopy feature for elemental identification, JEOL's JCM-6000 NeoScope (NeoScope II) can help materials analysis and pharmaceutical scientists accelerate their research. The electron microscope can be particularly useful as a high-throughput failure analysis tool due to its ability to image defects, surface blemishes, and foreign materials. It has a space-saving design and offers quick loading, push-button imaging, and multiformat image download.

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