Equipped with StepWave™’s off-axis ion source technology, Xevo G2-S® QTof and Xevo G2-S Tof mass spectrometers are up to 20x more sensitive than earlier-generation instruments. StepWave ion optics technology transfers ions from the ion source with high efficiency while actively filtering out undesirable neutral contaminants. As a result, MS signals are increased, quantitative results are more reproducible, and laboratories experience less downtime due to routine cleaning and maintenance.