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October 15, 2012 (Vol. 32 , No. 18)

FE-SEM Platform Extension

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ZEISS

An extension of the field emission-scanning electron microscope (FE-SEM) platform Merlin is now available. Customers can now choose between the systems Merlin Compact, Merlin VP Compact, and Merlin and configure them individually. The plug-and-play feature allows the customer to add and change detectors to handle tasks ranging from image capture to extensive material analysis. A frame store of 32 k x 24 k pixels allows imaging of large areas. New features include in situ 3D surface reconstruction and calculation of 3D data from 2D data. The in-lens Duo detector offers both high-resolution imaging and materials information.

  • ZEISS
  • One Zeiss Drive
  • Thornwood NY, 10594
  • UNITED STATES

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