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December 1, 2012 (Vol. 32 , No. 21)

FE-SEM for Nanoscale Analytics

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ZEISS

The high-definition FE-SEM Sigma HD offers customers high-resolution imaging and sample navigation for nanoscale analytics. In addition, it provides a range of analytical options through diametrically opposite chamber ports that facilitate the mounting of two energy dispersive x-ray spectroscopy detectors for maximum solid-angle detection. In the instance of beam-sensitive samples, this permits low-probe currents to be used while maintaining high x-ray count rates. The geometry afforded by the chamber design helps eliminate x-ray shadowing effects.

  • ZEISS
  • One Zeiss Drive
  • Thornwood NY, 10594
  • UNITED STATES

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