The high-definition FE-SEM Sigma HD offers customers high-resolution imaging and sample navigation for nanoscale analytics. In addition, it provides a range of analytical options through diametrically opposite chamber ports that facilitate the mounting of two energy dispersive x-ray spectroscopy detectors for maximum solid-angle detection. In the instance of beam-sensitive samples, this permits low-probe currents to be used while maintaining high x-ray count rates. The geometry afforded by the chamber design helps eliminate x-ray shadowing effects.