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Carl Zeiss
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FE-SEM Platform Extension
Carl Zeiss
An extension of the field emission-scanning electron microscope (FE-SEM) platform Merlin is now available. Customers can now choose between the systems Merlin Compact, Merlin VP Compact, and Merlin and configure them individually. The plug-and-play...
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FE-SEM for Nanoscale Analytics
Carl Zeiss
The high-definition FE-SEM Sigma HD offers customers high-resolution imaging and sample navigation for nanoscale analytics. In addition, it provides a range of analytical options through diametrically opposite chamber ports that facilitate the moun...
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