With a magnification range of up to 60,000X, redesigned with touchscreen software controls, and an optional energy-dispersive X-ray spectroscopy feature for elemental identification, JEOL's JCM-6000 NeoScope (NeoScope II) can help materials analysis and pharmaceutical scientists accelerate their research. The electron microscope can be particularly useful as a high-throughput failure analysis tool due to its ability to image defects, surface blemishes, and foreign materials. It has a space-saving design and offers quick loading, push-button imaging, and multiformat image download.